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Usually the tip protection occurs when the sum drops to a value that is too small. This might happen due to poor laser alignment or if the cantilever has a poor coating. Does it happen with every probe or just that one? I've never seen the system automatically increase the scan size like that (except when I meant to type 150nm and I typed 150um
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Hi Basavarja, As Stephan notes, both SPMLab and NanoScope software have simple controls in ramp mode where you can type in the approach rate or retract rate that you desire. These rates control the speed of the piezo during ramping, so they are indirectly related to the loading rate (which would presumably be dF/dt where F is the load). To measure the
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Hi Fangfang, Another thing that can cause large adhesion is blunt or contaminated tips. If changing to a fresh sharp probe helps, this is probably the issue! --Bede
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The first thing to check is the DMTModulus Limit. Increase it and see if that helps. If that does not solve the problem, it is likely that there is something wrong with your sensitivity calibration -- I would suggest entering a low value (maybe 10 nm/V) for the deflection sensitivity and see if that helps. If so, put in a hard, clean sample and redo
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To be clear, the difference between the "Deflection error" and the "Deflection" is that the "Deflection Error" = "Deflection" - "Setpoint". In versions of NanoScope prior to (approximately) version 7, the "Deflection Error" was labeled "Deflection". --Bede
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Hi Ki-Rak Kim, In Nanoscope v5 and earlier we did not support opening files with older versions of Nanoscope if the files were created in newer versions (even within the same major version number). However, there is a command line option that can sometimes override this behavior -- I would say that it is worth trying, but I don't have high hopes
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Correct. The R given in the Hertzian model equation above is an effective radius which is defined as you have stated. Usually the AFM tip end radius is much smaller than the radius of curvature of the sample. If that is not the case, the sample radius of curvature must also be considered. --Bede
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Hi Iwei, The Hertzian model uses the equation F=1.33*E*R^0.5*d^1.5 where F is the force, d is the deformation of the sample, and E is the reduced modulus. You must use the "Separation" plot, not the "Z" plot to get the deformation for the fit. If you do, the Nanoscope Hertzian fit reports the equation that fit the data, so 1.33*E
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Hi Heather, The issue that Peter and Guillaume have been attempting to help you with occurs in older versions of Nanoscope when the a file has been collected, but never opened offline with Nanoscope. When the file was initially opened, the header was converted from binary to ASCII. Once the conversion is done, any newer version of Nanoscope or Nanoscope
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Hi Jeremy, As you can see from the screenshot in my previous post, it is also possible to export the data as TIFF or Ascii. Many analysis software packages allow import from those formats. Additionally, you can save the files in a Nanoscope v5 compatible format using the "Crop and Split" analysis. What analysis software do you want to use