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  • Re: Modulus vs. deformation

    Your question is very precise. There is a confusion between stiffness and rigidity moduli. These are two different things. Briefly, the stiffness is the derivative of the load force with respect to the deformation (incline of the force curve). It has the dimension of force/length. And it does depend on the load force and the AFM probe used. Rigidity
    Posted to SPM Digest (Forum) by Igor on Wed, Jun 29 2011
  • Re: Surface Potential and Probes

    Hi Sheila, I assume that you are speaking about surface potential which is the work function (if this is the surface potential on nonconductive surfaces, it is the entirely different story.) Did you try Kelvin method? It should give you the absolute value of the surface potential (of course, if your material is sufficiently homogeneous). If you sample
    Posted to SPM Digest (Forum) by Igor on Sat, Jun 11 2011
  • Re: Liquid crystal solution

    Sounds extremely challenging! Just ot clear, AFM/SPM is a surface imager. The maximum what you can do is the imaging on interfaces. We imaged the surface of liquid crystals when they grow on interfaces ( Advanced Materials , 1997. 9 (11): p. 917) with micellar resolution. By some reason, the best was the tapping mode with "force modulation"
    Posted to SPM Digest (Forum) by Igor on Tue, Feb 1 2011
  • Re: Question about Poisson coefficient

    Hi Esther, It is really depends on the sort of material you are dealing with. If you can make a rectangular robust sample of several centimeters, the problem will be trival. Poisson coefficient can be found as a simple geometrical ratio (see, wiki for example). If you have a mechanical engineering dept., they amy have a suitable machine. If not, it
    Posted to SPM Digest (Forum) by Igor on Thu, Nov 4 2010
  • Re: image filtering

    Bede, I second to the idea to add similar function to any of the nanoscope software. We use it in WSxM. It is called " Flatten using paths ". It allows one removing ugly parallel zones/changes of high of the image (mostly due to the laser jumps) without introducing artifacts which make it virtually impossible to derive real step height information
    Posted to SPM Digest (Forum) by Igor on Fri, Aug 20 2010
  • Re: Maximum indentation depth using the AFM in contact mode

    Ashok, I suggested a few comments a few hours ago, and still do not see it posted. At the same time, yours just appeared . In one of my notes, I suggested to check the constancy of the rigidity modulus. Your comment on having a hyperelastic material is puzzling. It is typically a matter of deformation where the material demonstrates hyperelastic properties
    Posted to SPM Digest (Forum) by Igor on Sun, Aug 15 2010
  • Re: Maximum indentation depth using the AFM in contact mode

    Dr. Ram, I would like to add to the comments of others that probably the most universal way to answer you question is to do multiple indentations with different depth and calculate the rigity modulus. If the modulus is constant, you are in the valid regime (of course, there might be some special conditions wheh even this is not true, but it is very
    Posted to SPM Digest (Forum) by Igor on Sun, Aug 15 2010
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