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Hallo Stefan, thanks a lot, I already did. Best regards Jonas
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Hallo, is it possible that the z-board of the controller is responsible for this? Best regards Jonas
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Hallo Sam, this article could help you: Cleaning AFM colloidal probes by mechanically scrubbing with supersharp “brushes” Best regards Jonas
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Hallo, I repeated the measurement with a D-scanner and a NSC36B(Si3N4) cantilever on a Si-substrate. The data is shown in the graph. The same strange behaviour occurs like in the measurement before. So I think the scanner should be OK... What do you think is the reason for this behaviour and what should I do next? Thanks a lot for your help. Best regards
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Thanks a lot for your help, I will keep you posted. Unfortunately time is too short to contact tech support... Best regards Jonas
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Hi Steve, thanks for your help. I don't have another scanner at the moment but i will try to organize one. Unfortunately in the next three weeks i will not have the possibility to do new measurements. Best regards Jonas
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Hallo Ben, thanks for your help. The sample was a UMG03 calibration grating. But the same behavior of deflection-sensitivity i observe on cleaned Si-wafer. The non-contact deflection is usually kept zero and after automatic approach the z-position of the scanner (and also the xy) are centred. I will send the actual data files to you and would be great
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Hallo everybody, I am using a multimode afm with a nanoscope IIIa controller, AS-130VLR scanner and nanoscope 5.31r1 software. When recording force-distance-curves at different ramp-sizes for determination of deflection-sensitivity i observe a dependence of deflection-sensitivity on ramp-size. This dependence is not an effect of scanner calibration