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  • Re: Questions regarding AFM force calibration

    Hi again Huabin, The deflection channel is literally an image of the variation in your setpoint, so on average it should be some definite value (your setpoint - apart from peaks and troughs when the probe encounters sharp height variation). So you can take this value and use it as the "z" value in the Hookes' law equation I mentioned previously
    Posted to Off-Topic (Forum) by Ian Armstrong on Thu, Dec 2 2010
  • Re: Questions regarding AFM force calibration

    Hi Huabin, The normal loading force for imaging or force curves is simply calculated using Hookes law F=kz. There are various ways to determine the spring constant k [N/m] (see one of our application notes regarding this). z [m] is determined by multiplying the deflection sensitivity [m/V] by the setpoint [V] and by setpoint I mean difference between
    Posted to Off-Topic (Forum) by Ian Armstrong on Mon, Nov 29 2010
  • Re: Standard sample for Kelvin probe microscopy

    Hi Karin, For Kelvin Probe measurements I always find the best "standard" sample is simply an interdigitated electrode sample that you can apply user selected bias to and then read out in the Kelvin Probe measurements. Even simpler is to use something like HOPG that is electrically connected to the AFM chuck and again verify you measure changes
    Posted to SPM Digest (Forum) by Ian Armstrong on Fri, Nov 26 2010
  • Re: Tip Resonant Frequency and Force Constant

    Hi Gronfisk, Firstly the resonant frequency scales with the square root of the spring constant. The main consideration for resonant frequency and force constant is whether the tip will be used in contact or tapping modes. In contact mode you generally would like a low spring constant to minimise both samples and tip damage. In tapping mode you would
    Posted to SPM Digest (Forum) by Ian Armstrong on Thu, Nov 11 2010
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