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Dimension FastScan Brochure

Posted to Brochures & Data Sheets (MediaGallery) by Hector Lara on Mon, May 2 2011
Dimension FastScan

Today Bruker Nano Surfaces Division announced the innovative and unique Dimension FastScan AFM, which delivers a significant breakthrough in improved imaging speed without sacrificing nanoscale resolution. The Dimension FastScan enables users to obtain usable data significantly faster than is possible with other commercial AFM systems. It is simply

Posted to SPM Digest (Forum) by Hector Lara on Mon, May 2 2011
Re: trouble in Icon

Fangfang, One of our applications engineers will be addressing your question regarding the calibration parameters mismatch, in th emeantime, please send the data image to my email address with any questions you may have and I will make sure you get your answers. Thank you, Hector Lara Sr. Product Manager AFM Metrology hlara@veeco.com

Posted to SPM Digest (Forum) by Hector Lara on Tue, Jun 1 2010

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