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Hi Mike The 2011 AFM calendar has been distributed. Please directly contact the person below with your address details and we will send one out to you (including last years version). Regards Dean Dawson, Product Management. EMAIL CONTACT: Tracy.Kim@bruker-nano.com
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Atomic Force Microscopy (AFM) is a well-established metrology technique used in semiconductor at 65nm nodes and below. Measurement precision, and accuracy are foundational to the AFM including the added benefits of not being a direct, non-destructive technique that is not affected by feature material or shape. In this application, the AFM is used in