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Hi all, I have a question about EFM measurements in "scan" and "ramp" modes. The strange thing is that EFM phase shift values in interleave (lift) mode on the same sample surface area are different. Below is the picture illustrating this mismatch. In the left side is the image of EFM phase difference distribution the surface of GaAs
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Normal 0 19 false false false MicrosoftInternetExplorer4 Normal 0 19 false false false MicrosoftInternetExplorer4 Hi all, we have zero point shifts in our Dimension 3100/Nanoscope IVa system with Extended TUNA module. I attached graph illustrating the shifts. Reference measurements of commercial diode were made with Keithley 2601 source meter and I
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I think it could be caused by contamination from the sample (or tip). It should also appear on smaller scan sizes (~50um).