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Thank you for your responses. I will try the ScanAsyst tips as you suggest.
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I need to be able to image poly-Silicon grain boundaries and characterize, as much as possible, the depth of the boundary. Thus, I require a very sharp and high aspect ratio tip. The CNT and SS tips seemed to hold the best promise for accomplishing this daunting task.
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I would like to use a TESP-SS tip as well as a high aspect ratio tip purchased from another manufacturer (CNT-FM, 2.8 N/m, 150 kHz, carbon nanotube, from Nanosensors) with ScanAsyst. Do you have any strategies for using ScanAsyst with these fragile tips as these cantilevers are not ideal for ScanAsyst?