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  • Re: Questions regarding AFM force calibration

    Normal 0 false false false MicrosoftInternetExplorer4 Hi Ian, In my experiment, I usually calibrate the cantilever before performing other measurements. So, it’s no problem to convert the data from volts to nanometers. As to ‘out-of-contact’, I am sorry for this confusion, which actually means the value (nm) of the baseline of a force
    Posted to Off-Topic (Forum) by huabin on Fri, Dec 3 2010
  • Re: Questions regarding AFM force calibration

    Normal 0 false false false MicrosoftInternetExplorer4 Dear Ian, Many thanks! Do you mean that we still need to collect a force curve (without changing the set point) immediately after the collection of the deflection image since we need to know the non-contact value of the cantilever in order to determine the z value? In my experiment, the sample is
    Posted to Off-Topic (Forum) by huabin on Thu, Dec 2 2010
  • Re: Questions regarding AFM force calibration

    Normal 0 false false false MicrosoftInternetExplorer4 Many Thanks, Ian. I think I did not describe my problems clear enough. More straightforward, my question is how to calculate the normal force exerted on a sample from an image captured with the Data Type set to Deflection ? Cheers, Huabin
    Posted to Off-Topic (Forum) by huabin on Mon, Nov 29 2010
  • Questions regarding AFM force calibration

    Normal 0 false false false MicrosoftInternetExplorer4 Dear All, I am a research associate in the University of Melbourne, Australia, and have several questions on how to calculate the normal loading force (not include the adhesion force) exerted on a sample imaged using a Nanoscope IV AFM (software Nanoscope 5.31r1). Some guys suggested that the normal
    Posted to Off-Topic (Forum) by huabin on Sun, Nov 28 2010
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