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Hi Stefan, My sample is a carbon substrate which is used in PEM fuel cell. It is highly conductive and i am reaching saturation current (1.18 uA) even with a very small bias of 500 mV. I have seen articles and they have shown current in mA using conductive AFM. I google and found that Park AFM have module called variable enhanced conductive AFM (VECA
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I am Dimension Icon AFM with TUNA module. I am doing current imaging on my sample and i notice that at 100 nA/V sensitivity, i can get maximum current of 1.18 uA. I was wondering is there any way i can get current in the range of mA?
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Hello, I have Dimension Icon AFM with extended TUNA module and have some issues regarding I-V measurement. I did current imaging on my sample using conductive AFm with bias voltage of 500 mV and current sensitivity of 100 nA/v. My sample is catalyst layer which is made of carbon black particles and nafion polymer. As expected, i see areas of high current
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Hi John, Thanks for your suggestion. I tried nanoindentation mode and use 'surface delay' for 10 second. It doesn't hold the tip on the sample, what it does was to not record the data for that amount of time. If you can give me your emailid i can show you the force curve without surface delay and with surface delay. Its basically the same
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Hi, I have dimension Icon AFM and doing indentation under QNM mode using TAP525A. I want to give a delay time where tip is hold against the sample during indentation against the load and would like to see that effect in force displacement curve. I used surface delay and retract delay option but it didnt worked The surface delay just does not record