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Just to add to the previous post, we observed the same signal even when we did not apply sample bias.
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Hi, Thanks for the prompt reply. The image below is a section analysis of the image. As you can see, the current image mirrors the deflection image, but not the height image(although there is certain relationship between the height image and current image as well). However, when I zero the proportional gain and integral gain of the feedback system,
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Hi, we are using a veeco multimode AFM with conductive afm application module to investigate the surface electrical properties of our sample. The signal we got is in picoampere range (appro. 30 - 70 pA) and it shows a very strong correlation between the current image and the deflection image when we ran the test with relatively low feedback gain. The
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Thanks for the suggestion and opinions. Our sample is an insulator (the resistivity is around 10e15), so at first we thought the bias wont make much different to the measurement we are doing. In fact, very little change has been observed even we applied a -12volt sample bias. I guess we would try to connect an external circuit to measure the voltage
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Hi! We are using C-AFM to create a current map based on piezoelectric effect by applying different deflection setpoint. Although we could get a contrast in the current map, we are not sure about the direction of the current (flowing into the sample from the tip or flowing out the sample into the tip) based on the current map. Hence, may I know if we