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I think I might have used the wrong term. I would like to put a bias on the tip and map the phase shift due to electric forces at a lift height ( EFM). Can I do this with a standart DI3100 system?
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On the interleave options, I see an option to apply a bias voltage on tip through analog 2. Are you saying this will not work? Thanks for the reply, Ashish
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I am using a Dimension 3100 AFM system to perform some conducting AFM scans on a sample with alternating strips of gold and SiO2. To apply a bias on the tip can I use the standard probe holder or would I need to use a EFM probe holder? Can you point me to any useful manuals that talk about the hardware & software setup to take EFM images. Thanks