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Dear Joop, Thank you for your reply.Here is more informations: I am imaging in air, using the normal cell holder. The sample I am imaging consists of Aluminium oxide thin films. The room is temperature controlled at 21 degrees celcius. Concerning the J scanner, I don't think it is not a closed-loop scanner. When imaging, my deflection setpoint is
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Hi! I came accross two rather strange phenomenum today when I tried to image one of my sample using the MultiMode V AFM, using the J-scanner and the Nanoscope V controller (contact mode). First, when the probe is scanning the surface, it seems that the z-piezo constantly extends, until eventually reaching the Z-limit (set to the maximum value of 4.7um
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Thank you for your quick reply. I will contact the service contact in order to find out about it then! Ben.
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Hi all I have just come across this forum, and as I will be using an AFM quite extensively for my PhD studies, this space will, as I am sure, prove quite useful! My first post is regarding a problem I cannot resolve. When I try to run lithography scripts on the Nanoscope v7.3 software, that the "Run Script" command, located under the "Tool"