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Ian 1. Is Surface Potential AFM quantitative for electrical measurements? 2. How can I calibrate Surface Potential AFM to get quantitative electrical measurements (potential)? 3. How can we get the work function of the tip and how can we load that in the system? 4. We acquired our Icon in July of 2012. My guess is that we may not have Peak Force KPFM
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1. Is Surface Potential AFM quantitative for electrical measurements? 2. How can I calibrate Surface Potential AFM to get quantitative electrical measurements (potential)? 3. How can we get the work function of the tip and how can we load that in the system? 4. We acquired our Icon in July of 2012. My guess is that we may not have Peak Force KPFM on
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1. Is Surface Potential AFM quantitative for electrical measurements? 2. How can I calibrate Surface Potential AFM to get quantitative electrical measurements (potential)? 3. How can we get the work function of the tip and how can we load that in the system? 4. We acquired our Icon in July of 2012. My guess is that we may not have Peak Force KPFM on
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Jonathan, Do you a table which summarizes what/strength of the tip to be used for given samples with specific magnetic properties? Thank you, Wilson
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Bede, Thank you Bede for your response. What is the thickness of the standard PSFilm normally provided upon acquisition of Icon AFM with PF-QNM? What substrate is the PSFilm deposited on? Thank you, Wilson
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Bede, Thank you Bede for the answers. What the the thickness of the standard PS film provided upon acquisition of Icon AFM. What subtrate is the PS film deposited on? Thank you, Wilson
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Bede, We acquired Dimension Icon AFM in July with PF-QNM capabilities. We were provided with standards for PF-QNM such as PDMS soft 1 (2.5MPA), PDMS soft 2 (3.5 MPA) and Polystyrene (2.7GPA). I took the polystyrene and did measurements on it using the Hysitron nanoindenter, and I found the modulus to be 106GPA. 1. Why such disparity? I have read somewhere
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Hi Bede, Singh posted the question below and I was also interested about the answer. Thank you "hello While going through one of the Application Support Bulletin By Bruker regarding nanoindentation calculations I found the following: "It is difficult to get Young's modulus with the NanoScope AFM nanoindenting technique. The modulus depends
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That is a great question Singh. I am also waiting for an answer to that. Wilson
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Ben and Bede, I have a question concerning the new offline nanoscope analysis software. Does this new software work for force distance curves acquired while doing nanoindentation (i.e with diamond probes) or can it also be applied for force distance curves generated using silicon nitride tips typically used for contact mode AFM? Thank you, Wilson