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Hello Stefan, Thanks for your reply Actually, the topography one is clear as well as the amplitude one. Although in DLC coatings usually there is not much difference between pictures coming out of height and amplitude channels. But during the tunning, there are some noise and/or sudden steps in phase graph not in the amplitude one, which after finishing
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Hello every one, I am working on the phase imaging of the thin DLC coatings on the silicon (roughnees of about 2 nm). The AFM machine is Dimension 3100 and the tip is NCHV (available in the lab). I have notice that it is so difficult to have a crystal clear phase images with this kind of tip. Even after a few times of using, the phase graph in tuning
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I have reach to another question? after few days of nanoindentation, suddenly there is no more indentation on the surface after indenting. the substrate that I am using is silicon. With different forces applied there are different force calibration plot but no indentation at all. in some samples there might be polymeric parts due to modifications, is
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Thanks Bede, it was a short but sharp answer which I was waiting from the company for weeks... Good luck in your research Ranna
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Thanks a lot Bede... it was a helpful tip... and maybe simple, but I am new in AFM!! but I was wondering if with this data that I have now, can I plot the typical nanoindentation graph which usallu can be extracted by Nanoindentater test?... I have extracted the ASCII file of the indentation, but there is no connection between the extend data and retract
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Hello I have some problem with measuring the hardness value of the thin film by using PDNISP tip on AFM. I am using the Nanoscope Analysis, but just hte Young's modulus is calculated not the hardness. Could some one with more experience on measuring the hardness and young's moduls help me on this matter? Regards Ranna