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Hi everyone; I was wondering, what exactly happens during the operation of the Update Sens button in PFQNM mode, while imaging on the PS-LDPE reference sample for example? Thanks a lot in advance Cheers Amir
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Greetings Teddy; I appreciate the suggestions, very helpful. Cheers Amir
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Hey Mark; I am sorry for the late reply, been away for a while. As you know the value of the deflection sensitivity is strongly dependent on the machine, on the position of the laser spot on the cantilever,.... which makes it impossible to give a general reference value for this parameter. Yet, here is the way I do it, and I hope it helps you: 1.Perform
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Hi; finally the main problem was the deflection sensitivity calibration (too high or too low sensivities). Now I am obtaining reasonable results. Thanks again for helps. Cheers Amir
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Dear Joop, I will take into account your recommandations when next week I will be running some tests, I will let you know the result. Thanks a lot though for the comments and suggestions. Cheers Amir
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Thanks a lot Joop; I will check it out. Cheers Amir
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Greetings; I was wondering if someone could help me on this. Thanks a lot in advance. I am using PFQNM on a Dimension Icon using normal tapping probes with a k around 40 N/m. After having followed the typical calibration steps I can not finalize the calibration on the PS thin film reference sample. Technically, the initial modulus values on this sample
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Hello; I am using the HarmoniX mode and sometimes I see the inverse of topographical features appearing in the property channels. I was wondering, what would be the origin of that? In most of my experiences the usual case is observing that similar traces of surface topography are slightly reflected in the property channels. Thanks in advance! Cheers