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Hi Bede, To follow with another, but related, question, is there any way to export raw data for use in other analysis software? Could this be an option in the future? Thanks, Jeremy
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Thanks Stefan, I seem to have the correct tip holder. However, I still do not know how to apply this mode. There is nothing in the D3100 manual about Torsional Mode. Also, are there any probes that may be better at reducing these effects? Perhaps a broader tip such as the diamond doped or the SCM-PIC with a lower spring constant? Any additional input
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Thanks for the clarity Stefan. I assumed as much but thought I would spend some time trying to mitigate. I'm not familiar with torsional resonance - is this a seperate mode availabe to some applications?
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Yes, tapping mode corrects this issue (another reason I would think it is lateral/friction forces), unfortunately CAFM is not available on this model in tapping mode.
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I am curious about a common artifact seen in Contact mode measured in conjunction with CAFM bias to a CdTe sample. These lateral lines seem to be independent of any settings I have control over. They appear in both the topography and the CAFM map. I assumed they were a function of lateral forces against the probe, but I seem to have no control over