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So I figured out the difference between the z data: In Nanoscope analysis I was looking at "Z sensor" data while Gwyddion was plotting "Z" data. If I switch the X Data Type in Nanoscope Analysis from "Z sensor" to "Z" I get the same spacing and overall length as with Gwyddion. Could someone please explain the
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Sorry, I meant to write that I am still concerned about the horizontal axis data spacing (which is Z sensor not deflection).
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Hello Dietmar, I agree the data is noisy, but at the moment I am more concerned if the software is correctly reading/plotting the deflection axis data as discussed in my original post. By the way, I don't know what is the sign convention for the "Z sensor," but if I select either Deflection or Separation vs. "Z" (rather than
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Thank you, Dietmar. Here are a few sample files: force curves.zip
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Hello Luis, I am using a D3100 Nanoscope V with Nanoscope software v7.30. With Gwyddion 2.31 I have not had any trouble opening the force curve files. I do not seem to have the header field you list. I do have: \@4:Ramp Begin Zsweep: V [Sens. Zsens] (0.005035400 V/LSB) 0 V \@4:Ramp Begin: V [Sens. Zsens] (0.005035400 V/LSB) 0 V \@2:DC Sample Bias: V
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Update: I saw that a new version of NanoScope Analysis was available after posting my question, so I updated the software; however, the issues discussed above remain unchanged.
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I was analyzing some force-distance curves using NanoScope Analysis and noticed unusual spacing between the horizontal scale data points. The difference between data points was either 0, 0.167, or 0.333 nm in a seemingly random way. This seemed odd to me. When I open the same file in Gwyddion, though, the spacing is a constant 0.1953 nm, which is consistent
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Thank you, Janne. Zooming in on the region of interest did help. Calculating the spring constant is still pretty sensitive to the position of the cursor bars, but now I can see if the fit looks any good. After testing different cursor positions I got what seemed to me to be a pretty good fit and the calculated spring constant is somewhat reasonable
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I am new to force measurements and I am having trouble with the thermal tune method to calibrate the cantilever's spring constant. I would appreciate any help. I am using TESP probes with a D3100 system and Nanoscope software v7.30. I start by calibrating the deflection sensitivity on a silicon wafer, typically getting values around 37 nm/V. (from
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Hi Mark, Thanks a lot for your response. I've actually been having less trouble with this issue lately; however, I can't really explain why. For unknown reasons, it just stopped being as much of a problem. Increasing the Histogram Filter Cutoff to >0 during depth analysis is a good recommendation--thanks. I've consistently noticed that