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hello
While going through one of the Application Support Bulletin By Bruker regarding nanoindentation calculations I found the following:
"It is difficult to get Young's modulus with the NanoScope AFM nanoindenting technique. The modulus depends on the slope of the unloading curve of the indent and the indent force curves generated with this technique are not true sample deformation, but instead the sum of cantilever deflection and sample deformation, which is typically difficult to decouple"
Is it impossible to calculate Young's Modulus using Nanoscope AFM or Is there any way to calculate this property of certain material using Nanoscope AFM.
Thanks
SAndeep
That is a great question Singh. I am also waiting for an answer to that.
Wilson
Hi Sandeep,
The difficulty was caused by the lack of analysis software, not any problem with the data acquisition (although you will need an accurate deflection sensitivity calibration obtained by ramping on a hard sample (like sapphire)). The latest version of Nanoscope Analysis has a function called 'indentation analysis' that can apply an elastic fit to your calibrated force curves. This can be automated using run history if you have a lot of curves. You can get a copy of Nanoscope Analysis by following the instructions here: http://nanoscaleworld.bruker-axs.com/nanoscaleworld/media/p/2740.aspx
Instructions on how to use the new functionality can be found by looking under Help>What's new...
Good luck!
--Bede