Forums
Bruker Media
Community Media
Bruker AFM Probes
SPM Digest
Application Notes
NanoTheater
Website
中文
Brochures & Datasheets
Publications
Probes Catalog
Events
Manuals & Documentation
Presentations
Guide to AFM Modes
News
Journal Club
Webinars & Video
Nanovations
Other
Dear Sir/madam
can anyone tell how SCM data can be quantified???
If there is any literature giving information regarding quantification of SCM data..please share the link
Thanks........
SAndeep
Sandeep,
SCM data quantification has been attempted, but not with widespread success. Here is a quote from "Scanning Probe Microscopy" Edited by Sergei Kalinin: http://www.ebooks.com/302033/scanning-probe-microscopy/kalinin-sergei-gruverman-alexei/
I.3. Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics .................. 88 J. J. Kopanski
Quote:
"Several software packages have been developed to extract 2D dopant profiles from SCM images, including DPAK from the University of Utah [56], SCaMsim from ETH in Zurich [44], and FASTC2D from the National Institute of Standards and Technology [30]. These packages all use different models for calculating the C-V curve between the SCM tip and sample. However, they all use some variation of the calibration curve method to extract dopant profiles from SCM images." "Several software packages have been developed to extract 2D dopant profiles from SCM images, including DPAK from the University of Utah [56], SCaMsim from ETH in Zurich [44], and FASTC2D from the National Institute of Standards and Technology [30]. These packages all use different models for calculating the C-V curve between the SCM tip and sample. However, they all use some variation of the calibration curve method to extract dopant profiles from SCM images."SCM images, including DPAK from the University of Utah [56], SCaMsim from ETH in Zurich [44], and FASTC2D from the National Institute of Standards and Technology [30]. These packages all use different models for calculating the C-V curve between the SCM tip and sample. However, they all use some variation of the calibration curve method to extract dopant profiles from SCM images."
Chunzeng