The Nanoscale World

Bruker Fuels the Future of Graphene

rated by 0 users
This post has 0 Replies | 1 Follower

Top 50 Contributor
Posts 18
Points 178
Bruker Employee
Tracy Krainer Posted: Thu, Apr 4 2013 3:58 PM

Innovation with Integrity

bruker logo

Bruker Fuels the Future of Graphene

April 2013

MultiMode Plateform
AFM topography image showing wrinkles in graphene layers at area of interest.
ribbon cutting
This modulus image shows fine structures with greater compliance seen as darker areas on the modulus map image.
Atomic force microscopy has been part of graphene researchsince Andre Geim and Konstantin Novoselov's discovery started the field. The early TappingMode™ images, acquired with a Bruker MultiMode® at locations pinpointed by an optical survey, unambiguously identified the single graphene layers that had previously been thought to be inaccessible. 

The years following this discovery have seen a veritable explosion of graphene research activity with over 100 publications so far using Bruker AFMs. Those studies include investigations into the fabrication of graphene and graphene oxide. They also address the wide ranging applications envisioned for graphene from flexible displays and fast electronics to actuators, biosensors, and composites. 

Advanced property measurements have played a key role in these exciting advances, including studies utilizing Bruker's exclusive PeakForceQNM® for unraveling graphene layering and quantifying the graphene metal interactions controlling the electrode bonding in electrical device applications. Other groundbreaking research includes nanoscale conductivity investigations on composites and functionalized graphene  and KPFM investigations clarifying the charge percolation pathway in graphene-based organic hybrid FET devices. 

ribbon cutting
Raman spectroscopy allows for fast mapping of graphene layer structure through G-band intensity.
Even more exciting advances enabled by the latest Bruker technology may be yet to come. For example, PeakForce KPFM™  may permit extending hybrid device investigations to higher spatial resolution with more quantitative measurements and correlation with local material variations. In addition, future conductivity studies may benefit from the proven ability ofPeakForce TUNA™ to provide the highest spatial resolution on the most mechanically fragile samples.
© 2013 Bruker Corporation. All rights reserved.

Nano Surfaces Division, Bruker Corporation
112 Robin Hill Road • Santa Barbara, CA 93117, USA • Tel: +1 (805) 967-1400
Page 1 of 1 (1 items) | RSS
Copyright (c) 2011 Bruker Instruments