Forums
Bruker Media
Community Media
Bruker AFM Probes
SPM Digest
Application Notes
NanoTheater
Website
中文
Brochures & Datasheets
Publications
Probes Catalog
Events
Manuals & Documentation
Presentations
Guide to AFM Modes
News
Journal Club
Webinars & Video
Nanovations
Other
Could someone please recommend to me the best (and simplest) way of doing the following:(1) Comparing two images (that have drift between them) to find the best possible overlap (I'm guessing a correlation program of some sort).(2) Then trimming both images so they show the same area.(3) Subtracting the resulting images from one another.I know I can do this "visually" in photoshop etc., but I'm hoping there is a more precise solution on offer. At present I have the images as both bitmaps, and also in RHK's native format, *.SM4.
ou can do the comparison by performing cross-correlation. The coordinatesof the maximum on the correlation image will give you the precise offset,calculated by statistical method. Then you can subtract one image fromanother, using calculated offset. All these operations can be performed inour software, FemtoScan Online. If you'd send me the original .sm4 files
WSxM 4.0 Develop 13.0 allows this process. First of all you have to open both images. Then select in the menu:(1) Process -> Filter -> Align images. Press on "Select Images..." to choose the images to align and press OK in both dialog-boxes.(2) Process -> Zoom or Process -> Multiple Dynamic Zoom to trim the same area in both images.(3) Process -> Filter -> Merge. Add both images using -1 as the Image Factor for one of them.
You can use the method of counter-scanned images. The method allows correcting drift in SPM images (direct and counter) followed by matching the corrected images in a coincidence point (the common point for both images). Usually, after matching, the corrected images are averaged within the overlap area but you can subtract one image from another. Both linear and nonlinear drift correction approaches may be applied, depending on the accuracy required.See details in the following paper "Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition" (Measurement Science and Technology, vol. 18, iss. 3, pp. 907-927, 2007). The paper is available online at http://www.nanoworld.org/homepages/lapshin/publications.htm#automatic2007