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Hello all,
Recently, when I am trying to go through the calibration steps for pfqnm I am getting a rather high (2-3nm) indentation on the sapphire sample when calibrating the DDS3 amplitude (RTESP tip). As the sapphire should not deform at all I am not sure what possible causes are
I've managed to get the deformation down to +-500pm by manually adjusting the DDS3 amplitude (pft dlection is then still within 10% of ramp deflection), but I am not sure if I am 'allowed' to do that while calibrating. A problem I run into after this is that I can not get a deformation higher than 1-2nm on the PS..
Thanks in advance for your answers!Mark
correction, I mean deformation instead of indentation. I have not looked at force separation curves.
Hi Mark,
The force spectra on a saphire sample, with RTESP tip shoudl not show any deformation (or a tiny one). Deformation will be 'measured' if there is a hysteresis in your force spectrum. Is it possible that osmething else causes the hysteresis? Maybe the tip (or sample0 is a bit contaminated, and the contamination laye ris being deformed?Itm might be helpful to see the actual force spectra which are used to extract the deformation you describe.
Regards,
Peter
Hey Peter,
Thanks for your reply. The only force curves I can find right now are in the ramp mode (trig threshold .2V). As you can see there is no hysteresis there, however the adhesion is quite high! (especially for the second one).
Like I said before, it is possible for me to drastically reduce the deformation by manually adjusting the DDS3 amplitude, but I don't know if that ruins the calibration procedure.
I do have two figures for the force curves on the PS, which also illustrate the invariance of the deformation to my peakforce setpoint (top figure is PFSP = 200nN, bottom PFSP = 1uN)