AFM Probe Tip "Seizure" During Y Offset

N-ElHinnawy posted on Tue, Jul 6 2010 4:23 PM

rated by 0 users

Problem:
During scans, the probe tip will violently shake and displace itself (as seen through the scope) several tens of microns in the +y or -y direction, then continue to scan, then violently shake and displace itself back to its original position.  It only happens when I set a nonzero Y offset, and when it is set back to zero the "seizing" ceases, but my probe has obviously been damaged as I lose lots of lateral resolution.  When I withdraw the tip, my alignment on the photodiode is way off and is no longer centered.

Observations:
-only seems to happen with some tips, although it seems completely random which tip it will "seize" on
-has become increasingly frequent to that point that it happens about 50% of the time with a new tip
-oscillations of around 1nm amplitude have recently begun appearing on quartz substrates that are normally incredibly smooth from CMPing (show up at 45* angle) and become mirrored when scanning in the opposite direction.  I've gone back and imaged quartz that I've imaged before that didn't have these oscillations.  It shows up for these samples, so I'm pretty confident its an artifact

I don't think this is tip related as it has happened with PPP-NCH's, PPP-NCHR's, OMCL-AC160TS's, Veeco TESPs, Veeco NCHV-A's, Nanoworld TESPs, and just today Veeco SCM-PIT's.

I know my description may be confusing, but any help is appreciated.  If I can get a quick export approval I can post a picture of the oscillations, but no promises.

Thanks for any help