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Dear all,
I tried to do STM on HOPG with our new Dimension Icon AFM with scanasyst but the tip keeps crashing all the time during engagement. I tried the scan parameters set in the manual but the tip still crashes. The bias voltage was increased from 100mV to 500mV, the gains increased to ( integral : 1, proportional :2) and the current set point decreased from 5.0 nA to 100 pA but the tip keeps crashing. The sample conducts well, it was checked with a multimeter.
Can anyone help?
Thank you Li,
I identified the problem. It was SPM feedback. It should be set to linear not log. Now it works perfect.
Best regards
Mops
Hi Mops,
Please contact Bruker AFM tech support. They will work with you to solve the issue.
Best, Stefan
Thank you Stefan
Can you please check:
If the above does not solve the problem, please take a screenshot of the error message and send over.
Chunzeng LiApplicaiton scientistBrukerChunzeng.li@bruker-nano.com
Dear Li,
I checked the bias between the sample and the piezo guard, they are the same as the one set in the software, whenever the software bias is changed the other changes accordingly.
I made sure the tip is more than 1mm above the sample, it took long to approach but it crashed.
There is no error message on the screen during engage, it is the usual engage message that shows the tip: "pre-engage" then " approaching surface" . I can only see by the sample moving that the tip has crashed and of course the would be a mark showing that on clean HOPG.
I changed the bias to 1000mV , increased the gains ( integral: 1 proportional : 500) and reduced the current setpoint to 100pA but the tip crashed.
Thank you