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Enabling Conductivity Measurements and Material Assignments on Nanostructures, Organic Solar Cell and Lithium Battery Materials
This Webinar is also being broadcast live in Chinese - see our Chinese Forum for more details on time and date
Chunzeng Li, Ph.D.
Applications Scientist
Nano Surface Business, Bruker
chunzeng.li@bruker-nano.com
AFM-based conductivity measurements (called C-AFM or TUNA) are powerful techniques for nanometer scale electrical characterization. This class of measurements was first enabled with a contact mode AFM equipped with a conductive tip and a current sensing module. However, the use of Contact Mode for topographic feedback has proven to be a severely limiting factor for samples that require low imaging forces (such as conductive polymers, organics or other soft conducting materials, or loosely bound samples such as nanowires).
PeakForce TUNA is the union of conductive AFM measurements and Bruker's PeakForce Tapping mode of operation, and it leverages the best of both elements. Borrowing the unparalleled force control of PeakForce tapping, PeakForce TUNA enables, for the first time, current imaging on extremely soft and delicate samples, as well as, superior tip lifetime for current imaging on hard samples. In both cases, the enhanced force control improves the repeatability and resolution of the conductive AFM imaging. PeakForce TUNA also includes a quantitative nanomechanical property mapping suite, thereby providing electrical information simultaneous with topography and mechanical property information (Deformation, Adhesion, DMT Modulus, and Dissipation).
This webinar discusses the basics of PeakForce TUNA, compares it to standard Contact Mode based TUNA, and provides data demonstrating the unique capabilities and the differentiated applications enabled through the combination of PeakForce Tapping, and AFM conductivity measurements, on samples such as organic solar cells, lithium ion battery, and nano-materials.
Learn how PeakForce TUNA:
• Enables reliable nano-electrical imaging on soft delicate samples such as loosely bound nanostructures, conductive polymers
• Enhances material assignments on the nanoscale by making use of both quantitative nano-mechanical and nano-electrical properties
• Preserves sample and measurement integrity with integrated ppm environmental control in battery and organic electronic (solar, LED) applications
• Improves imaging resolution and tip lifetime while making conductive AFM measurements easier
Register for the live 8:30 AM PST broadcast
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