The Nanoscale World

Easy AFM: Atomic Force Microscopy made simple.

Mon, Jan 4 2010

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Easy AFM: Atomic Force Microscopy made simple.


Designed with the infrequent or novice user in mind, Easy AFM® provides a single interface that presents the user with all of the inputs required to obtain high quality Tapping Mode® images on a majority of samples in air. Two of the hardest things for new users to become familiar with is the process of mounting cantilevers and the alignment of the laser used for feedback detection. More than just an automated algorithm interface, Easy AFM guides the user through the basics of changing the cantilever and aligning the laser using a series of hardware specific pages.

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