Fast-Scanning with the NanoScope IV SPM Controller and TappingMode+™ - Textured Hard Disk
Fast-scanning is the new ability to scan a sample at speeds up to 10 times faster than possible with conventional AFM/SPM systems. This translates to complete scans in seconds vs. minutes while maintaining integrity and accuracy.
The movies below show conventional and fast-scanning, respectively, with NanoScope IV on a calibration sample. The conventional scan was performed at 1Hz (one scan line per second), while the fast-scan was performed at 6Hz. Both scans were 25µm.
Fast-scanning is available in TappingMode+ and Contact Mode. The data here is TappingMode (and TappingMode+) data, which is generally the first-choice scanning mode for most applications.