This datasheet describes the NEOS – a high resolution surface inspection microscope.
NEOS combines AFM with a research grade upright optical microscope.
Application Areas for the NEOS:
- Metallurgy
- Coatings (on metal, glass, etc.)
- Optical Industry (Glass, polymer for glasses and lenses)
- Fibers
- Micro Patterned Devices/Laser Ablation
- Defects in SiC / sapphire LED substrate (not PSS!)
- Defect inspection in general
NEOS users want to look at:
- Defects
- Patterned/structured sample
NEOS helps if
- AFM area is hard to find
- dark field or DIC are required