The Nanoscale World

Advances in Combined Atomic Force and Raman Microscopy


posted by Bruker
Mon, Oct 24 2011

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Advances in Combined Atomic Force and Raman Microscopy

Atomic force microscopy and Raman spectroscopy are both techniques used to gather information about the surface properties of a sample, yet their respective user base is often quite different. There are many important application reasons to combine these two technologies, and this application note looks both at the complementary information gained from both techniques and how a researcher having access to a combined system can benefit from the additional information available.

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