The Nanoscale World

Dimension Icon AFM-Raman

posted by Bruker
Mon, Oct 24 2011

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Dimension Icon AFM-Raman

Today’s requirements on micro- and nanoscale characterization instrumentation go far beyond the capabilities of a single measurement method. The complimentary techniques of atomic force microscopy and Raman microscopy provide critical information on both the topography and the chemical composition of a sample. When these techniques are further enhanced with advanced AFM modes, such as Bruker exclusive PeakForce TUNATM electrical characterization and PeakForce QNM® quantitative nanomechanical mapping, researchers are able to better understand the mechanisms that lead to specific material properties.

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