Today’s requirements on micro- and nanoscale characterization instrumentation go far beyond the capabilities of a single measurement method. The complimentary techniques of atomic force microscopy and Raman microscopy provide critical information on both the topography and the chemical composition of a sample. When these techniques are further enhanced with advanced AFM modes, such as Bruker exclusive PeakForce TUNATM electrical characterization and PeakForce QNM® quantitative nanomechanical mapping, researchers are able to better understand the mechanisms that lead to specific material properties.