The Nanoscale World

Quantitative Mechanical Property Mapping at the Nanoscale with PeakForce QNM


posted by Bede Pittenger
Thu, Apr 15 2010

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Quantitative Mechanical Property Mapping at the Nanoscale with PeakForce QNM

The atomic force microscope (AFM) has long been recognized as a useful tool for measuring mechanical properties of materials. Until recently though, it has been impossible to achieve truly quantitative material property mapping with the resolution and convenience demanded by AFM researchers. A number of recent AFM mode innovations have taken aim at these limitations, and now, with the release of PeakForce QNM™ by Bruker, it is possible to identify material variations unambiguously and at high resolution across a topographic image. This application note discusses the principles and benefits of the PeakForce QNM imaging mode.

Comments

Lars Mininni wrote re: Quantitative Mechanical Property Mapping at the Nanoscale with PeakForce QNM
on Thu, Apr 5 2012 4:50 PM

FYI, this PDF file seems to be missing, as I get the error:

The requested URL /fileadmin/user_upload/application_notes/Quantitative_Mechanical_Property_Mapping_at_the_Nanoscale_with_PeakForce-QNM_AFM_AN128.pdf was not found on this server.

Thanks,

-Lars

Bede Pittenger wrote re: Quantitative Mechanical Property Mapping at the Nanoscale with PeakForce QNM
on Mon, Apr 9 2012 12:41 PM

I put the file back up.  Thanks for the heads up!

--Bede

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