The Nanoscale World

Dimension Icon Brochure

posted by Stephen Minne
Wed, Dec 16 2009

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Dimension Icon Brochure

Bruker’s Dimension Icon Atomic Force Microscope (AFM) System introduces new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized largesample AFM platform, the latest Dimension system is the culmination of decades of technological innovation, customer feedback, and industry-leading application flexibility. The system has been designed from top to bottom to deliver the revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours. The Dimension Icon also is now equipped with proprietary ScanAsyst automatic image optimization technology, which enables easier, faster, and more consistent results, regardless of user skill level. Highest level AFM research with radical productivity gains has never been easier to achieve.

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