Bruker’s Dimension Icon Atomic Force
Microscope (AFM) System introduces new levels of
performance, functionality, and AFM accessibility
to nanoscale researchers in science and industry.
Building upon the world’s most utilized largesample
AFM platform, the latest Dimension system
is the culmination of decades of technological
innovation, customer feedback, and industry-leading
application flexibility. The system has been designed
from top to bottom to deliver the revolutionary
low drift and low noise that allows users to
achieve artifact-free images in minutes instead of
hours. The Dimension Icon also is now equipped
with proprietary ScanAsyst automatic image
optimization technology, which enables easier,
faster, and more consistent results, regardless of
user skill level. Highest level AFM research with
radical productivity gains has never been easier
to achieve.