The Nanoscale World

ScanAsyst Brochure


posted by Stephen Minne
Wed, Dec 16 2009

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ScanAsyst Brochure

ScanAsyst is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate parameter adjustments. This makes imaging as easy as simply selecting a scan area and scan size for almost any sample in either air or fluid.

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