PeakForce QNM is a groundbreaking
atomic force microscope (AFM) imaging mode that
provides AFM researchers unprecedented capability to
quantitatively characterize nanoscale materials. It maps
and distinguishes between nanomechanical properties,
including modulus and adhesion, while simultaneously
imaging sample topography at high resolution. PeakForce
QNM operates over an extremely wide range, approximately
1 MPa to 50 GPa for modulus and 10 pN to 10 μN for
adhesion, enabling characterization of a large variety of
sample types.