The Atomic Force Microscopy Webinar Series - Recording:

A First In-Depth Look at the New Dimension® Edge™ AFM System and its Applications

Overview

Learn all about the new Dimension Edge Atomic Force Microscope (AFM) Closed-Loop system and its applications. The Dimension Edge leverages many Veeco innovations to provide solid performance in a large-sample AFM at a moderate price range. The heart of this system is Veeco’s astonishing closed-loop scanner that debuted in the successful Dimension Icon range. To maximize the benefit of having this state-of-the–art scanhead, the stage features a rigid, drift-compensated bridge structure that includes FPGA-based thermal control to provide fast stabilization to ultra-low drift rates. Thus, the Dimension Edge combines the productivity, accuracy and sample versatility of a large-sample, closed-loop platform with the acquisition of high-resolution images traditionally only achieved by small-sample, open-loop instruments. Join us for this webinar to learn how these advances enable applications in your work.

Presenters

Stefan B Kaemmer, Ph.D., Senior Research, Veeco Instruments, Inc.

Thomas Mueller, Ph.D., Product Manager, Veeco Instruments, Inc.

ORIGINAL BROADCAST DATE:

Thursday, March 25, 2010