Due to their unique absorption fingerprint, many materials can be conveniently characterized in the infrared spectral region. However, diffraction limits the spatial resolution to several microns. Here we present the Bruker Inspire with PeakForce IR, an integrated nanocharacterization tool that enables straightforward nanoscale infrared absorption and reflection imaging while simultaneously accessing nanomechanical and -electrical information with molecular resolution.
We will show new results in biomolecular, polymer, and graphene plasmon imaging, and explain the complete workflow for obtaining these new kinds of high-resolution correlated data.