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The PicoForce manual is the best bet for v6 force curve instructions. Do you have a copy of this? If not, send me your email and I can forward you a copy. Steve
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Alperen, Try following the instructions here: http://nanoscaleworld.bruker-axs.com/nanoscaleworld/forums/t/526.aspx Or email me at steve.minne (at) bruker-nano.com and I will post. Steve
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UC Berkeley - Bruker Advanced AFM Workshop (Formerly Veeco) AFM has been used for many years for ultra high-resolution microscopy and has earned a reputation as a powerful but complex tool. Recent advances by Bruker are making AFM easier to use, providing more unambiguous and quantitative information, and extending the ability of AFM to work with the
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Sorry Umar, we don’t provide access to the DSP or FPGA on our systems. If you think I could help on a specific application you are trying to accomplish, let me know. Steve
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Hi, Can you post an image or line trace of the problem you are having? I am not completely clear of the issue from your post. Also, what system and scanner you are using? Thanks, Steve
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Dave, In general you just need a tip with a sidewall steeper than the sample; for example a fib tip may work here. There are also some asymmetric tips out there that are overhanging in one direction (including the scan angle). In either case, scan much slower than normal because of the steep sidewall. You will not resolve detail on the sidewall, but
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All, Nice paper on high resolution MFM by Morgan et. al. in Nature Physics. Data taken using the MM and Dimension. Check it out at: http://www.nature.com/nphys/journal/v7/n1/full/nphys1853.html Steve
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Torbjorn, To use the functionality contained in documents you reference you need to have a special version of the SW with enables the COM communication. I don’t believe you have this. If you are interested in learning more, for MM8, contact Ben.Ohler (at) bruker-nano.com. Thanks, Steve
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JOB TITLE: North America Sales-Application Manager DEPARTMENT: Sales MANAGER: Jeff Doran PREPARED BY: Peter De Wolf PREPARED DATE: December 15, 2010 SUMMARY: The North America Sales-Application Manager is responsible for management of Bruker Nano’s Application Team supporting the Research AFM, Stylus Profiler & Optical Profiler product lines
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Quantitative mapping of elastic moduli at the nanoscale in phase separated polyurethanes by AFM Peter Schön, Kristóf Bagdi, Kinga Molnár, Patrick Markus, Béla Pukánszky, G. Julius Vancso http://dx.doi.org/10.1016/j.eurpolymj.2010.09.029 The micro phase separated nanoscale morphology of phase separated polyurethanes