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Hi, which Nanoscope and which Gwyddion are you using? I've obtained force curves using Nanoscope III and V controler, but I can't open neither of them with Gwyddion 2.26. It gives me the following error: Header field `@4:Ramp Begin DC Sample Bias' is missing Do you have the @4:Ramp Begin DC Sample Bias line in your files?
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Hi Nina, I do not know why you are having trouble exporting the force curves, but If you use Matlab I have some scripts I found on the web that can export the force curves directly from the HSDC files. They have the advantage that you can deal with many files at once. You should tell me which version of Nanoscope you used to acquire the HSDC files.
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Hi, it's has been a long time since they have updated this post, but I'm interested in the comment Alperen Ketene made, but I can not see all the answers to this posts, neither Stefan Kaemmer's answers nor the link http://www.veeco.com/nanoscaleworld/forums/p/399/628.aspx If anyone has any info about it I would appreciate it!
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Hi, I was wondering why the deflection voltage obtained on the In0 channel of the Signal Access Module differs from the one shown by the software. This was noted in a previous post: http://nanoscaleworld.bruker-axs.com/nanoscaleworld/forums/p/821/1992.aspx#1992 "Note that on nanoscope 3 and 4 systems, the cantilever deflection signal (as displayed
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Thanks Stefan! You answer helped me a lot, especially the concept that you need to work on the attractive side of the force curve!
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Hi everyone, I have been doing some reading about obtaining atomic resolution with AFM and there is a main issue that I don't understand. Do you need a single tip atom to interact with a single atom from the sample to obtain atomic resolution? If a tip radius is larger than 20 nm is it possible to have single atom interaction or atomic resolution
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Hi Harmut, thanks for you explanation! It helped a lot! I am now doing some indentations on an anealed polymer with an Antimony doped Si tip (diamond doped coating and nominal cantilever spring constant 20-80 N/m); this are typical Load-piezo displacement and corresponding Load-depth curves (after calibrating the sensitivity on a Si sample) that I obtain
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Hi all, I'm starting to make indentations with the AFM. I obtain Force-piezo displacement curves, but I would like to know how to relate the piezo displacement to the actual penetration depth of the tip in order to obtain the Force-displacement curves mentioned in the literature and used to draw information about the elasto-plastic behaviour of
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Hi Tejasvi, I have also done force-distance curves in contact mode in air on Silicon. I'm new in the subject and it would be nice if you could take a look at my results to check if they are similar to yours. In the graph below I show the mentioned force-distance curves for three different tips, where the slopes of the linear curves are shown in