-
Dear Veeco AFM users, We are pleased to announce the release of the latest version of Nanoscope Analysis (v1.20r1sr3), Veeco's free offline image processing software. Download by following the directions in the attached .pdf file: Nanoscope Analysis v120r1sr3.pdf ****** Title: Nanoscope Analysis v1.20r1sr3 Description: NanoScope Analysis is a software
-
Justin, I pasted a couple of recipes below, but unfortunately neither are a water based; I don't have of one of those. . . Is sound like it's working for you in organics, but in the past, we have found that depending on the source of the CNTs, their quality can vary and there can be a lot of other carbon junk in there and that can cause problems
-
Andres, I don't think you need a diamond tip if you are concerned about tip wear in imaging (you may want to consider it if you are trying to do mechanical measurements on hard surfaces though - see the app note: Quantitative Mechanical Property Mapping at the Nanoscale with PeakForce QNM AN128.pdf Check out this thread for a discussion on tip wear
-
Andres, 50um is a pretty large scan; scanning that at 1Hz results in a tip velocity of 100um/s! Slowing down to 0.1Hz brings this down to a more reasonable 10um/s. (On many samples it would not be unusual to scan 5um at 1Hz = 10um/s.) The nice thing about ScanAsyst is that it makes these corrections, and keeps you in a “safe” zone automatically
-
That level of noise is way too high. From what you describe it sound like you have a ground loop problem. These can sometimes be tricky to isolate, but often can be found with just good grounding practice. In general try to get all of your grounds to a single point. This can be done by plugging all of your equipment in at the same point. Or by using
-
Alperen, The application note is the best place to start: Quantitative Mechanical Property Mapping at the Nanoscale with PeakForce QNM AN128.pdf The brochure provides a good overview: B073-RevA0-PeakForce_QNM-Brochure_HiRes.pdf Dr. Chanmin Su has a paper accepted on the technique, but not yet published, so I can’t distribute, but can be discussed
-
Presentation Date: 8/5/2010 Presentation Time: 10:30:00 AM - 11:00:00 AM Presentation Room: B114 - Oregon Convention Center ******* NanoScale Quantitative Mechanical Property Mapping Using Peak Force Tapping Atomic Force Microscopy S. C. Minne, Y. Hu, S. Hu, B. Pittenger, C. Su Veeco Instruments, 112 Robin Hill Road, Santa Barbara, CA 93110 The AFM
-
Peter, I am out of the office today, but will send you an offline link to the CD when I return. Steve
-
Philippe, The HarmoniX calibration procedure is outlined in detail in our manual. Send me you email/phone number offline ( sminne@veeco.com ) and I will set up a call to go through it, and your other questions with you. Steve
-
Peter, Please find the Support note attached here: Nanolithography Support Note.pdf (If you received the standard factory shipment for Litho you should have the user manual documents already. If not I can send you a link for the CD.) This support note details NanoLithography theory, NanoScript™ syntax for performing lithography commands and procedures