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Hi Benjamin, I believe the purpose of 10 MOhm resistor is to restrict the current flowing through the tip-sample gap. The breakdown of the gap however depends not on the electric current but on the field in the gap and can take place at very low voltages. If you do calculations of the current densities through the gap that will most probably show the
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Hi Harman, It looks like your experiment will rely on the humidity of the nitrogen from a “can” or a line. The excessive pressure setup however will allow blowing the nitrogen away through the slits and the pores of your environmental chamber compared to the vacuum allowing the air from the room leaking into. The environmental chamber for
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Hi Stefan, Thank you for your comments. I am just putting the general consideration to the reproducibility of the measurements with conductive probes. In some of my experiments I was able to restore the metal layer on the tip by applying higher bias voltage for a couple of seconds. The probe after these experiments was absolutely warn out as seen under
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Hi Peiman, please consider the built-in voltage of the probe - sample junction that may affect your electric measurements. That may explain IV curve shift from 0V for example. The modification of the surface (both oxidation in air and roughness increase) at pre-acquisition scanning can be a major problem too. Try to mimimize the cantilever load at imaging
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Would you be able to examine the tips with SEM or tip calibration gratings? Could it also be a bad contact of the chip with probe holder? Cheers, Dmitry MIAWiki
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I would just add my 20 cents to the answer from Stefan. Tip shape can be changed any time under following factors: initial shape, how sharp the tip is combination material/coating of the probe bias voltage (1V can already be high enough to modify a coating of a sharp probe) load on the probe (matter of rigidity of the probe) scanning mode for imaging
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I would just add my 20 cents to the answer from Stefan. Tip shape can be changed any time under following factors: initial shape, how sharp the tip is combination material/coating of the probe bias voltage (1V can already be high enough to modify a coating of a sharp probe) load on the probe (matter of rigidity of the probe) scanning mode for imaging
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Nuclei Volume Estimation: http://confocal-manawatu.pbworks.com/w/page/16346886/Confocal%20Measurements%20Lab%20ImageJ
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Permalink to AFM Deconvolution Software at MIAWiki: http://confocal-manawatu.pbworks.com/w/page/43681258/AFM%20Deconvolution%20Software Cheers, Dmitry
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Thank you Steve, I'll try Dwydion. The permalink on the topic at MIAWiki: http://confocal-manawatu.pbworks.com/w/page/43681258/AFM%20Deconvolution%20Software Thanks again, Dmitry