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I think this will damage the tip. The pressure is too large for the tip. Usually I use the rubber ball to blow the dust away.
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Hello everyone, I find 2 bugs while using Nanoscope Analysis 1.4. 1) If I open the AFM original file by Nanoscope Analysis 1.4 and save the modification, the file can not be open by NanoScope Version5.12(the software for AFM measurement) anymore. 2)When I export 3D images through Nanoscope Analysis 1.4, the length unit ´µm´ can not
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Thanks a lot Chunzeng. I am curious about the tuning of Lock- in phase / interleave for a long time. But it is not introduced in the manual book. The microscope profile of surface potential in our AFM automatically set Lock- in phase/ interleave to 0 with the green balloon on. By the way, I use software Version 5.23. I will try your suggestion later
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Hello Chunzeng, Thanks a lot for your reply! 1. I quantify the CAFM noise from peak to peak. 2. The Pt/Ir coating is only 20 nm thickness. On the bottom, the tip is also coated with 3nm Cr. This coating is being used during the measurement. I almost cannot get the repeatable CAFM results of one sample. I don´t know when the Pt/ir coating has been
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Hello, I have a question concerning CAFM. Once the tip contacts the sample surface, the current noise increases to 500pA with high sensitivity sensor. When I lift the tip up and off the surface, the current noise reduces to 2pA. I don´t know it is normal or not. This situation does not happen for every sample. Thanks!
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Hello, Is it possible to turn off the laser during the measurement? I used contact mode. So it is important to have the laser signal to determine the deflection of the cantilever. Thanks!
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Hi friends, 1) The noise during the CAFM measurement suddenly changed. Before, the current noise was around 2pA (High current sensor 1nA/V). Now it is 10pA. Does it has something to do with the wear of the tip (SCM-PIC)? 2) By the way, I test the current signal on the sample chuck with a new tip. But the current signal appears until the DC sample bias
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Thanks a lot Joop. I change the z-scale and the pictures are not so much different.
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Hi Friends, I scanned a sample 2 days ago by contact mode and repeated it today. But the image looks weird today. The upper image was scanned 2 days ago. The lower one is scanned today. The sample should have the structure shown in the upper image, i.e. small particles. What is the reason for this problem? I use the tip SCM-PIC.
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Sorry, I typed wrongly. I mean the convex lump on trace line is conversely a pit on the retrace line.