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Thanks Stefan for your reply. Here is the screenshot. Just on the right side of the big peak, there is a small high lump of the trace line(white). But conversely a small convex pit on the retrace line(yellow).
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Hi everyone, I scan over a flat Si wafer surface by contact mode(Conductive-AFM) with tip SCM-PIC. There is always a gap between the trace and the retrace line, around 6 nm. Is it a water film? The deflection setpoint is 0.3 V, but i have to pull the tip out of surface by setting the ´deflection setpoint´= -0.5 V, instead of 0V. The worse
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Hi Friends, How to set the ´drive phase´ of surface potential detection? I know the drive phase depends on the resonant frequency of the cantilever. I use SCM-PIT tip, with the resonant frequency of 78.4kHz. I can get the Potential signal since ´drive phase´=85°. When the ´drive phase´ increases, the data center
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It seems that the Pt/Ir coating of the tip is worn already. So the Si material appears. The semiconductor´ bands bend when it measures. Therefore, a dependence between potential and lift distance occurred. This dependence disappeared when I changed a new tip. What is your idea about it?
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Hi Friends, I found the signal of ´potential´ is alternating while I increases the lift distance or drive phase. For example, I measured the surface potential difference on the edge of Pt coating and isolator. I set the ´drive amplitude´ 1800mv, ´drive phase´ 105° and lift distance 150 nm. When I changed the lift
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Hi Friends, The mean value of Potential shifts 0.5~1 V when the lift distance between the tip and the sample increases or decreases 50nm. I have tried this on various samples, e.g. sample chuck, n-type Si wafer, Pt coating, isolators. All the results show the same, that the mean value of potential (or data center of potential scope) depends on the lift
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Oh no, I know what a stupid mistake I have made. The Potential scope was tilted because I didn´t notice that the ´Realtime planefit´was set to ´Line´ and ´Offline planefit´ to ´Full´. Actually, the original Potential scope was not tilted. But ´Line´ planefit applies first order planefit
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Hi Jakub, I have kept an eye on your question. I compared my pictures with yours and found the noise of mine was not as strong as yours. The noise of my pictures is in the Angstrom range. I thought it was the nature noise of electricity. For sure the noise can be seen when the Height rang is around 1 or 2 nm. I am curious that if the oscillation completely
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Hi Sandeep, I see what you mean now. I haven´t tried either MFM nor EFM by myself. What I could answer is based on just theories. For MFM, in the lift pass, the cantilever follows the stored surface topography and senses the change of phase or amplitude. Because the magnetic field will shift the resonance frequency of the cantilever. You may set
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Thank you very much Ben! It helps a lot. I have the SCM-PIT tip for conductive- AFM measurements. I can also use it for KPFM.