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Have to look if you can record more channels in this mode, not sure......
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Why do you not update to version 8.15, and use the PFQM with recording of "all" the force curves? Depending on the speed you can record 256*256 forcecurves. With the increased amplitude you can make force curves up to 2um ramp. How to get 8.15 is explained here .
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I don't think they are that different, the z-scales are very different. First make both scales the same e.g. 50 nm and compare again. There are some very high (dirt?) points there, and seeing the horizontal lines the tip could have picked up some of the dirt so that the tracking is not very good. Perhaps increase the setpoint a little bit if your
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After you finish a scan with the setpoint set to automatic, take the same picture with the auto setpoint in off position and set the setpoint first to a low value (60O pN) and take one with the hight setpoint ( 3 nN) and compare the height mesurements of the three pictures. I expect ther will be not mutch difference in the height, but there wil be differences
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After you finish a scan with the setpoint set to automatic, take the same picture with the auto setpoint in off position and set the setpoint first to a low value (60O pN) and take one with the hight setpoint ( 3 nN) and compare the height mesurements of the three pictures. I expect ther will be not mutch difference in the height, but there wil be differences
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Hello Ben, I am impressed by the new features in the force curve analysis! I really like the baseline correction and the indentation analysis. That you can do both things easy on multiple files with one click using the history button is great. For me it would be very handy if in the .txt file with the results also the maximum adhesion force was printed
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Oh...... probably I misunderstood what you wrote. So the pictures you show is not one scanline but is perpendicular on the scanlines....... Thats strange, no more idea's If you increase or decrease the scanarea you still have the same shape?
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If you increase the setpoint with 1V in contact mode, is it still the same? For me it looks like bad tracking..... If it is not bad tracking, check with a known sample (callibration grid) if the z sensor is still ok. Joop
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Use the Mask function to get the right treshold.......
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Hi Edy, As far as I know it is not in nanoscoop analysis, but have a look at the freeware program Gwyddion (search for "Gwyddion AFM" with google) You can measure the heights etc and show it as histograms or fit lines through the points without any problems. Nanoscoop analysis is good, but Gwyddion can do a lot more. BTW I have nothing to