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Hi friends, I have a question about the tip ´OTESPA´. Right now I use it for Kelvin Probe Microscopy measurements. As you know, the tip for KP measurement should be conductive. When I check the details of tip ´OTESPA´, it only says the back side of cantilever is coated with Al. Does this type´s tip have the Al coating also
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Sorry, there is no bias voltage problem of AFM. I took the wrong component as reference(i thought it was grounded, but actually not). The tilt of Potential scope is simply corrected by setting ´Realtime planefit´ to ´Offset´. But it doesn´t solve the root problem, does it? Thanks a lot!
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Hi Chunzeng, Thank you very much for your suggestion. I have a try and report here. 1) I used a multimeter to verify the voltage on the sample chuck. When the Bias was 1V, the multimeter read as 0.25v. If I entered Bias 2v, the multimeter gave the value 0.5v. I guess some parts of AFM go wrong. But anyway, the 'actual' voltage seems to be 1
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Hi Sandeep, ´Deflection´ is a constant in contact mode. In the contact mode, the cantilever contacts the sample surface with a certain and constant force. The cantilever may goes up and down to follow the topography of the sample. But the contact force between the tip and the sample keeps constant. Therefore, ´Deflection´ of
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Thank you very much Pat ! The first method is working. Thanks a lot for your help!
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Hi Friends, I encounter a very weird problem that the engagement of tip fails. Right now I use ´Conductive AFM (Dimension 3100)´. After I press the ´Engage´ icon, the status says´ Moving to slow engagement position´, and then ´Approaching the surface´. BUT it immediately finishes the engagement and goes
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Hi Ang Li, you are right. I misunderstood Chunzeng´s suggestion. I will try then and report later.
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surface potential.jpg.aspx
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Hi Chunzeng, thanks a lot for your advise. I will try them out. A new question, the silver paint has to be removed every time after measurements. Will it make the sample chuck dirty? Although the si wafer is directly put on the sample chuck, the contrast seems not so bad. The ´dark´ particles are the inter-metallic compounds,on the top of
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Dear friends, I have some problems concerning surface potential detection. The most confusing one is the function of ´Bias´. The following statement is the details. I would be very grateful if you can leave your comments here. Equipment: Dimension 3100. NanoScope4 controller; Software: NanoScope V5.23 Sample: Si wafer as substrate, less