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  • Re: Scanning below 0.1Hz in NanoScope

    Is there any data on how reliable going below 0.1Hz is? What is the minimum scan rate you would reccomend without going outside the limits of the controller? Nabil
    Posted to SPM Digest (Forum) by N-ElHinnawy on Tue, Sep 7 2010
  • Re: Stripes on Surface Potential.

    Aaron: I don't know what sample you are attempting to do this on, but it seems as though it is an artifact of the imagining. I would attempt a scan at much lower tip velocities than you are using. Frankly, I wouldn't trust much data collected at a tip velocity of 70um/s. If its not possible to decrease the scanning area, you can at least achieve
    Posted to SPM Digest (Forum) by N-ElHinnawy on Tue, Sep 7 2010
  • Re: AFM Probe Tip "Seizure" During Y Offset

    If anyone there is interested, I captured video from the latest "tip seizing" and sent the video to Mark Hilton. I'll be attempting his suggestions later today to try and get rid of the problem.
    Posted to SPM Digest (Forum) by N-ElHinnawy on Mon, Jul 26 2010
  • Re: information about surface potentail measurement

    That's a pretty smart way to determine the KPFM sensitivity. I probably should have done that a while ago :) Do you have a ballpark estimate on what a pristine system should be able to resolve at a specific drive amplitude and lift (and material and tip...) ? In terms of the question, did the user really gave enough information? Wouldn't that
    Posted to SPM Digest (Forum) by N-ElHinnawy on Thu, Jul 22 2010
  • Re: probe questions for EFM/KPFM

    Stefan: I apologize, but my interest in the behavior and iridium content in the probes comes purely from my own ignorance of Iridium. I've never worked with Iridium, nor do I ever see it making its way into my lab. I should also clarify that when I say oxidation I don't mean a porous oxide like FeOx that can consume an entire metal, I meant
    Posted to SPM Digest (Forum) by N-ElHinnawy on Thu, Jul 22 2010
  • Re: probe questions for EFM/KPFM

    I was actually the one that initially started bugging Dave about this stuff a few weeks ago. Unfortunately in my email I typed SCM-PIC's when i meant SCM-PIT's. I assure you I am not using the contact tip for KPFM :) My questions on the iridium percentage were based on the quest to use a metal that doesn't oxidize, as oxidation layers will
    Posted to SPM Digest (Forum) by N-ElHinnawy on Thu, Jul 22 2010
  • Re: Conductive AFM

    For c-AFM I'd highly reccomend not using PPP-EFM. While it's a great KPFM tip its built for tapping mode, so its got a stiffer spring constant and will be more prone to breaking under contact conditions. Using any metal coated tip that is built for contact mode would give you more reproducible results
    Posted to SPM Digest (Forum) by N-ElHinnawy on Thu, Jul 22 2010
  • Re: AFM Probe Tip "Seizure" During Y Offset

    Oops, sorry about that. Dimension V (3100V) NSV Controller Nanoscope 7.30 Tapping in air
    Posted to SPM Digest (Forum) by N-ElHinnawy on Tue, Jul 6 2010
  • AFM Probe Tip "Seizure" During Y Offset

    Problem: During scans, the probe tip will violently shake and displace itself (as seen through the scope) several tens of microns in the +y or -y direction, then continue to scan, then violently shake and displace itself back to its original position. It only happens when I set a nonzero Y offset, and when it is set back to zero the "seizing"
    Posted to SPM Digest (Forum) by N-ElHinnawy on Tue, Jul 6 2010
  • Re: sample workfunction

    Alberto: The question you asked is unfortunately a lot more complicated than people want to admit. While extracting qualitative data from a KPFM image can be helpful, in order to extract quantitative data (like workfunction) you have to have many qualifiers in place. The most important part of the process is to know exactly what surface you are imaging
    Posted to SPM Digest (Forum) by N-ElHinnawy on Thu, Jun 17 2010
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