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Just figured out how to upload images. One is forwards and another is backwards. Thanks.
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Hi, we have a Dimension Edge AFM system for surface morphology analysis. But we are suffering from the artificial images for a long time. Please take a look at the following backwards and forwards height images. The oblique lines appear in almost all 5um X um and less scans. It will be grateful if you can help to solve this issue. Thank you. https:
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When the computer just starts up, you can press "DEL" key to enter "CMOS setting". Enter "PnP/PCI Configurations" --> "IRQ Resources", Change "IRQ-11" to "Legacy ISA"
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We called technician and fixed the problem. It was due to that the PC battery was exhausted and CMOS was initialized. This problem was solved by changing battery and resetting IRQ resource. Joop, still thanks for your reply.
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Hello. We are using Scanning Probe Microscope Controller (Nano Scope IIIa), Dimension 3100 Controller, in our lab for AFM measurement. Today, there were troubles when system started up. When computer started, there was a message: "At least one service or driver failed during system startup" Then we checked the event viewer, there are some
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Thank you so much, Mike and Steve.
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Hi Mike, Really appreciate your help. I can get good image now. I have another two questions about this measurement. First, I never used "stop box" with "flatten" in my previous analysis. I just clicked "flatten" then "execute". What's the difference of these two types of "flatten" and in which condition
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I am using Dimension 3100 to measure a deep pit (100-1000 nm deep), but in the scan direction bumps are always appeared adjacent to the pit. The bumps are not real surface morphology only appeared in the scan direction. I reduced the scan rate to 0.2 Hz, but the bumps were still there. Why are the bumps generated? Could you please teach me how to eliminate