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Hi All, We are trying to measure the distance between two features in Dimension ICON, sometimes the distance between them could be large ( around 50micron) so it will be time consuming and not accurate enough to just scan a large area ( since the maximum lines/sample we can use is 5120). So we are thinking to measure one feature first by a scanning
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Hi Stephen Thank you for your reply. I could only find this manual online http://nanoscaleworld.bruker-axs.com/nanoscaleworld/media/p/1212.aspx Is this the one you are talking about? Thanks,
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Hi All, We would like to do the local oxidation on Veeco icon AFM, what kind of tips would you suggest? Thanks, Yiming
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Hello Sean, Thanks for the reply, So the Depth automated AFM is a different system from the Dimension icon? Yiming
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Hi Steve, Thanks for the reply! yes, I will try the 5000x5000 pixels scanning, hope this can work for us! Thanks! Yiming
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Hi All, I'm trying to scan a large area ( probably 200micron x 200 micron) in order to get distance between some marks on my wafer. As far as I know, please correct me if I'm wrong, the largest area we could scan at a time is 100micron x 100 micron and it will sacrifice the lateral resolution, so I'm thinking to have multiple scanning and