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Stefan, FYI, Another co-worker happened to try out the same metal coated tip today. Here is his answer. It seems it is something you could have answer too... In any case, thanks for all your advices. Jay, ... and he just happened to use a metal coated tip in his AFM this morning, for the first time. He said that the laser sum was over 4. He said that
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Let me add on to this note. I tried the TESPA tip again. What I see is the drive frequency is much higher than TESP (350 mV vs 280 mV). Also, the SUM of the photodiode value is about twice (4) vs TESP. Could any of these two reasons be the cause of tip unable to engage and keep crashing ?? The 3rd TESPA tip crashed. There is nothing wrong with the tool
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I would like to know the sure way to align the laser beam on the tip cantelevers. I usually move the X, and Y knobs to find tip. There are two numbers on the monitor: SUM, and RMS value. I try to set the SUM to around 2, but is higher the value, the better ?? Also, what is the meaning of RMS value ?? Do I need to do anything different when aligning
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I read your #133 note, and also the AFM manual. Now I understand the "set point" and "drive frequency" concept. I still am not clear on "drive amplitude". Would you explain on this, or suggest a "better" manual ?? How does this Drive Amplitude affect my AFM scanning ?? Is this in any way, tied into how I would
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Before I talk to tech support, would you elaborate on "too low set point" ?? What is this doing and how would too low set point cause 'excessive wear' ??
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To add a bit more info, the problem I have with TESP tip is that it wears out like crazy on the Moly surface. I can scan couple nice images, then pull back, put in a 2nd sample. But the tip will never ever work on a 2nd sample. This I do not get. Is it wear, or is the tip crashing every time it approaches, ending up with a mangled tip it approaches
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scanning in air. The tip is TESP (standard). Nanoprobe IIIa is the model. Basically, I have to replace the tip after couple scans. I am never able to reuse the tip for the 2nd sample. The substrate is Moly sputtered film on glass. It is polycrystaline, with RMS roughness of 10 nm. I was told if I buy a better tip, I would have better luck. So, I purchased
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I am still having problems with AFM tip damage during approach (in tapping mode). Would you offer all the tips to avoid this?? I know to start with small scan area (like 1 nm) and low scan speed. Added to this, I ahve a basic question: What is "drive amplitude'?? Also, I can not get rid of the noise when I scan in 'phase' mode. What
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How do I save a AFM scanned image without the text/background ?? I tried "export" and I always get the background in the file. Many times, for presenations, I prefer to have just the top view image.
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You referred me to an answer that uses "Scanasyst", which does not exist on nanoscope IIIa. Do you have a solution for reducing tip wear for nanoscope IIIa users ??