-
We have the ICON, but not the catalyst. I want to overlay the modulus /adhesion channels for instance on the 3d topography. Can you suggest teh best possible way to do it? Ccan we enable MIRO on NS 8.1?
-
Thanks Ian. I was using Chrome, later I tried Firefox and IE too. Nothing works. It still says invalid credentials. Regards
-
every time i log out , the website prevents me from logging in. It makes me use the recover password option. I then have to wait for the new link to arrive in e-mail an then log in by entering the new password. It is quite trouble some. Can you help me resolve this?
-
Stefan, Thanks. I will try that out. It had not been used that much to wear out the coating though, I would think. But certainly that is probable. One of my colleague had sent out a mail with the images (screen shots of settings, images and force curves) attached to AFMSupport@bruker-nano.com .. but has not heard back. Is there anyone specific we should
-
Stefan, I did lower the setpoint after engaging, till almost the point where it would withdraw from the surface. We ordered a box of the softest RMN tips you mentioned but they turned out to be very bad investment as both the height and current images are nto comparabel to any of the original Bruker tips - PIC or PIT. The same sample when imaged with
-
We were getting nice height, current images and IV curves with SCM PIC tips on polymer semiconductors. We changed from PIT tips to conform to material hardness. But suddenly the same tips stopped working on the very same samples. We consulted with your support group people and even ordered RMN tips. The problem now is the PIC tips do not yield current
-
How can the "limit" be changed? where can it be accessed through in the software? I have been having trouble in getting any signal in dissipation and inphase window and was suggested to lower the limit
-
Thanks Hartmut for explaining the process so nicely and in such great detail. The insight on the use of the PS-LDPE reference sample ( the modulus of which was not mentioned in any of the Bruker app notes incidentally ) for a wide range of tips would certainly be a great help. I would try to implement your suggestions and get back with other questions
-
Hi Ang and Bede, I have tried to change tip, realign it and use relative method that does not require tip radius and spring constant determination. To get to to 2 nm deformation on PS sample from Bruker, the rtesp tip is requiring 150 nN force that is deforming the sample and still over estimating the dmt modulus, until I change the tip radius to around
-
Hi Ang, I have tried to change tip, realign it and use relative method that does not require tip radius and spring constant determination. To get to to 2 nm deformation on PS sample from Bruker, the rtesp tip is requiring 150 nN force that is deforming the sample and still over estimating the dmt modulus, until I change the tip radius to around 50 nm